The SPA-100 is a compact Optical Frequency-Domain Reflectometer (OFDR) add-on module for Santec’s tunable lasers. When paired together, the complete system enables the analysis of even the most compact and complex optical components, generating results for reflectivity, transmissivity, propagation loss, and the distance of specific events.
The entire system adopts OFDR (Optical Frequency-Domain Reflectometer) technology, allowing it to analyze the back reflection and transmission characteristics of fiber optic devices/components in the spatial domain. The system produces traces similar to those of an OTDR (Optical Time-Domain Reflectometer) but with higher resolution and accuracy. Boasting a sampling resolution of 5 μm, the system can easily identify structures in PICs (Photonic Integrated Circuits) and silicon photonics (SiPh) devices.
With a wide range of tunable laser options, the OFDR system is highly configurable and can operate within the spectral range critical to the Device Under Test (DUT), without being limited to a narrow wavelength band.
(1) Measures IL (Insertion Loss) and RL (Return Loss) on optical components
(2) Configurable based on Santec TSL (Tunable Laser Source)
(3) Designates regions of interest to analyze events/features of optical devices
(4) Defines multiple refractive indices for different regions of the trace
(5) Spectral analysis with a dynamic range of 70 dB
(6) Spectral analysis of reflective events
(7) Proximity sensing for waveguide alignment in SiPh and PICs
(8) Low sensitivity to reflective events with almost no blind spots
(1) Silicon photonics waveguide analysis
(2) Automated siphon wafer alignment
(3) Reflectivity measurement and analysis of optical components
(4) Wavelength-dependent component characterization
(5) Mating analysis of fiber optic connectors and cable assemblies
(6) High-resolution reflectivity analysis and length measurement
Compatible with Santec tunable lasers: TSL570, 710, 770
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